发明授权
- 专利标题: Resist composition and patterning process
- 专利标题(中): 抗蚀剂组成和图案化工艺
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申请号: US11872952申请日: 2007-10-16
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公开(公告)号: US07771914B2公开(公告)日: 2010-08-10
- 发明人: Jun Hatakeyama , Takao Yoshihara , Yuji Harada , Wataru Kusaki
- 申请人: Jun Hatakeyama , Takao Yoshihara , Yuji Harada , Wataru Kusaki
- 申请人地址: JP Tokyo
- 专利权人: Shin-Etsu Chemical Co., Ltd.
- 当前专利权人: Shin-Etsu Chemical Co., Ltd.
- 当前专利权人地址: JP Tokyo
- 代理机构: Westerman, Hattori, Daniels & Adrian, LLP
- 优先权: JP2006-282203 20061017
- 主分类号: G03F7/039
- IPC分类号: G03F7/039 ; G03F7/038 ; G03F7/20 ; G03F7/30
摘要:
A resist composition comprises a polymer comprising recurring units having formula (1) wherein R1, R4, R7, and R14 are H or methyl, R2, R3, R15, and R16 are H, alkyl or fluoroalkyl, R is F or H, R5 is alkylene, R6 is fluorinated alkyl, R8 is a single bond or alkylene, R10 and R11 are H, F, methyl or trifluoromethyl, R12 and R13 are a single bond, —O— or —CR18R19—, R9, R18, and R19 are H, F, methyl or trifluoromethyl, R17 is alkylene, X1, X2 and X3 are —C(═O)—O—, —O—, or —C(═O)—R20—C(═O)—O— wherein R20 is alkylene, 0≦(a-1)
公开/授权文献
- US20080090172A1 RESIST COMPOSITION AND PATTERNING PROCESS 公开/授权日:2008-04-17
信息查询
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