发明授权
- 专利标题: Signal-to-noise ratio measurement for discrete waveform
- 专利标题(中): 离散波形的信噪比测量
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申请号: US12030879申请日: 2008-02-14
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公开(公告)号: US07778785B2公开(公告)日: 2010-08-17
- 发明人: Takahiro Yamaguchi , Masayuki Kawabata , Mani Soma , Masahiro Ishida
- 申请人: Takahiro Yamaguchi , Masayuki Kawabata , Mani Soma , Masahiro Ishida
- 申请人地址: JP
- 专利权人: Advantest Corporation
- 当前专利权人: Advantest Corporation
- 当前专利权人地址: JP
- 代理机构: Chen Yoshimura LLP
- 主分类号: G01R29/26
- IPC分类号: G01R29/26
摘要:
There is provided a measuring apparatus for measuring a signal-to-noise ratio of a discrete waveform which is output from an AD converter in response to an input signal, where the signal-to-noise ratio indicates a ratio of a signal component of the input signal to noise generated by the AD converter. The measuring apparatus includes a spectrum compensating section that receives a spectrum of the discrete waveform output from the AD converter, and compensates the received spectrum in accordance with a non-symmetric sideband between an upper sideband and a lower sideband of the received spectrum, where the upper and lower sidebands are defined with respect to a fundamental frequency of the input signal, and a phase noise waveform calculating section that calculates a phase noise waveform of the discrete waveform based on the spectrum which has been compensated by the spectrum compensating section.
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