发明授权
- 专利标题: Substrate processing apparatus and method
- 专利标题(中): 基板加工装置及方法
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申请号: US12466525申请日: 2009-05-15
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公开(公告)号: US07779777B2公开(公告)日: 2010-08-24
- 发明人: Eishi Shiobara , Hirokazu Kato , Seiro Miyoshi , Shinichi Ito
- 申请人: Eishi Shiobara , Hirokazu Kato , Seiro Miyoshi , Shinichi Ito
- 申请人地址: JP Tokyo
- 专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人地址: JP Tokyo
- 代理机构: Finnegan, Henderson, Farabow, Garrett & Dunner, L.L.P.
- 优先权: JP2006-136613 20060516
- 主分类号: B05B15/02
- IPC分类号: B05B15/02 ; B05B3/00 ; B05B1/28 ; B05B13/02
摘要:
A substrate-processing apparatus includes a sample table which mounts thereon a to-be-processed substrate, a first line which supplies a chemical solution, a second line which supplies a cleaning liquid, a three-way valve connected to the first and second lines and configured to select one of the first and second lines, a filter provided across the first line upstream of the three-way valve, and configured to eliminate a foreign material from the chemical solution, and a nozzle provided downstream of the three-way valve and configured to discharge the chemical solution or the cleaning liquid when the first or second line is selected via the three-way valve. The three-way valve selects the first line when the substrate is coated with the chemical solution, and selects the second line in other cases.
公开/授权文献
- US20090226624A1 SUBSTRATE PROCESSING APPARATUS AND METHOD 公开/授权日:2009-09-10
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