发明授权
- 专利标题： Integrated optical detector in semiconductor reflector
- 专利标题（中）： 集成光检测器在半导体反射器
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申请号： US11092059申请日： 2005-03-28
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公开(公告)号： US07782921B2公开(公告)日： 2010-08-24
- 发明人: Andrew C. Alduino , Mario J. Paniccia , Rami Cohen , Assia Barkai , Ansheng Liu
- 申请人： Andrew C. Alduino , Mario J. Paniccia , Rami Cohen , Assia Barkai , Ansheng Liu
- 申请人地址： US CA Santa Clara
- 专利权人： Intel Corporation
- 当前专利权人： Intel Corporation
- 当前专利权人地址： US CA Santa Clara
- 代理机构： Blakely, Sokoloff, Taylor & Zafman LLP
- 主分类号： H01S5/00
- IPC分类号： H01S5/00
摘要：
An electrical-optical coupling and detecting device. An apparatus according to an embodiment of the present invention includes a reflective surface defined on semiconductor material. The reflective surface is to reflect an incident optical beam towards an optical destination. An optical detector is monolithically integrated in the reflective surface of the semiconductor material. The optical detector arranged in the reflective surface of the semiconductor material is to detect the incident optical beam.
公开/授权文献
- US20060215726A1 Integrated optical detector in semiconductor reflector 公开/授权日：2006-09-28
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