公开(公告)号：US09658396B2

公开(公告)日：2017-05-23

申请号：US13581858

申请日：2011-09-29

申请人： Haisheng Rong ,  Ofir Gan ,  Pradeep Srinivasan ,  Assia Barkai ,  I-Wei Andy Hsieh ,  Mahesh Krishnamurthi ,  Yun-Chung Neil Na

发明人： Haisheng Rong ,  Ofir Gan ,  Pradeep Srinivasan ,  Assia Barkai ,  I-Wei Andy Hsieh ,  Mahesh Krishnamurthi ,  Yun-Chung Neil Na

IPC分类号： G02B6/12 ,  G02B6/122 ,  G02B6/42 ,  G02B1/04 ,  G02B6/14 ,  G02B6/26

CPC分类号： G02B6/1225 ,  G02B1/045 ,  G02B6/1223 ,  G02B6/14 ,  G02B6/262 ,  G02B6/4201

摘要： Described herein are an apparatus, system, and method for providing a vertical optical coupler (VOC) for planar photonics circuits such as photonics circuits fabricated on silicon-on-insulator (SOI) wafers. In one embodiment, the VOC comprises a waveguide made from a material having refractive index in a range of 1.45 to 3.45, the waveguide comprising: a first end configured to reflect light nearly vertical by total internal reflection between the waveguide and another medium, a second end to receive the light for reflection, and a third end to output the reflected light. The VOC couples with a Si waveguide having a first region including: a first end to receive light; and an inverted tapered end in the direction of light propagation to output the received light, wherein the inverted tapered end of the Si waveguide is positioned inside the waveguide.

公开(公告)号：US07782921B2

公开(公告)日：2010-08-24

申请号：US11092059

申请日：2005-03-28

申请人： Andrew C. Alduino ,  Mario J. Paniccia ,  Rami Cohen ,  Assia Barkai ,  Ansheng Liu

发明人： Andrew C. Alduino ,  Mario J. Paniccia ,  Rami Cohen ,  Assia Barkai ,  Ansheng Liu

IPC分类号： H01S5/00

CPC分类号： G02B6/4246 ,  G02B6/4214 ,  G02B2006/12104

摘要： An electrical-optical coupling and detecting device. An apparatus according to an embodiment of the present invention includes a reflective surface defined on semiconductor material. The reflective surface is to reflect an incident optical beam towards an optical destination. An optical detector is monolithically integrated in the reflective surface of the semiconductor material. The optical detector arranged in the reflective surface of the semiconductor material is to detect the incident optical beam.

摘要翻译： 一种电光耦合和检测装置。 根据本发明实施例的装置包括限定在半导体材料上的反射表面。 反射表面是将入射光束反射到光学目的地。 光学检测器单片集成在半导体材料的反射表面中。 布置在半导体材料的反射表面中的光学检测器是检测入射光束。

公开(公告)号：US20060215726A1

公开(公告)日：2006-09-28

申请号：US11092059

申请日：2005-03-28

申请人： Andrew Alduino ,  Mario Paniccia ,  Rami Cohen ,  Assia Barkai ,  Ansheng Liu

发明人： Andrew Alduino ,  Mario Paniccia ,  Rami Cohen ,  Assia Barkai ,  Ansheng Liu

IPC分类号： H01S3/08

CPC分类号： G02B6/4246 ,  G02B6/4214 ,  G02B2006/12104

摘要： An electrical-optical coupling and detecting device. An apparatus according to an embodiment of the present invention includes a reflective surface defined on semiconductor material. The reflective surface is to reflect an incident optical beam towards an optical destination. An optical detector is monolithically integrated in the reflective surface of the semiconductor material. The optical detector arranged in the reflective surface of the semiconductor material is to detect the incident optical beam.

摘要翻译： 电光耦合和检测装置。 根据本发明实施例的装置包括限定在半导体材料上的反射表面。 反射表面是将入射光束反射到光学目的地。 光学检测器单片集成在半导体材料的反射表面中。 布置在半导体材料的反射表面中的光学检测器是检测入射光束。