发明授权
- 专利标题: Semiconductor device having SOI structure
- 专利标题(中): 具有SOI结构的半导体器件
-
申请号: US12399062申请日: 2009-03-06
-
公开(公告)号: US07786534B2公开(公告)日: 2010-08-31
- 发明人: Yukio Maki , Takashi Ipposhi , Toshiaki Iwamatsu
- 申请人: Yukio Maki , Takashi Ipposhi , Toshiaki Iwamatsu
- 申请人地址: JP Tokyo
- 专利权人: Renesas Technology Corp.
- 当前专利权人: Renesas Technology Corp.
- 当前专利权人地址: JP Tokyo
- 代理机构: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- 优先权: JP2006-002222 20060110
- 主分类号: H01L27/01
- IPC分类号: H01L27/01
摘要:
A plurality of conductive layers and a plurality of wiring layers connecting a supporting substrate having SOI structure and uppermost wire are formed along a peripheral part of a semiconductor chip together with the uppermost wire, to thereby surround a transistor forming region in which a transistor is to be formed.
公开/授权文献
- US20090194877A1 SEMICONDUCTOR DEVICE HAVING SOI STRUCTURE 公开/授权日:2009-08-06
信息查询
IPC分类: