发明授权
- 专利标题: Semiconductor device and method for manufacturing semiconductor device
- 专利标题(中): 半导体装置及半导体装置的制造方法
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申请号: US11951559申请日: 2007-12-06
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公开(公告)号: US07786589B2公开(公告)日: 2010-08-31
- 发明人: Noriaki Matsunaga , Yoshiaki Shimooka , Naofumi Nakamura
- 申请人: Noriaki Matsunaga , Yoshiaki Shimooka , Naofumi Nakamura
- 申请人地址: JP Tokyo
- 专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人地址: JP Tokyo
- 代理机构: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- 优先权: JP2006-329891 20061206; JP2007-290071 20071107
- 主分类号: H01L23/52
- IPC分类号: H01L23/52
摘要:
In one aspect of the present invention, a semiconductor device may include a semiconductor substrate having a semiconductor element on an upper surface, a first dielectric film provided on the semiconductor substrate, a second dielectric film provided on the first dielectric film, a metal ring provided in the first dielectric film and the second dielectric film and configured to form a closed loop in a plan view, a first region surrounded by the metal ring in a plan view, a second region provided outside of the metal ring in a plan view, a plurality of via contacts provided in the first dielectric film in the first and second region, a plurality of wirings provided in the second dielectric film in the first and second region, and an air gap provided in the second dielectric film in the first region.
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