Invention Grant
US07825026B2 Method for processing copper surface, method for forming copper pattern wiring and semiconductor device manufactured using such method 有权
铜表面处理方法,铜图案布线形成方法和使用这种方法制造的半导体器件

  • Patent Title: Method for processing copper surface, method for forming copper pattern wiring and semiconductor device manufactured using such method
  • Patent Title (中): 铜表面处理方法,铜图案布线形成方法和使用这种方法制造的半导体器件
  • Application No.: US11569144
    Application Date: 2005-06-03
  • Publication No.: US07825026B2
    Publication Date: 2010-11-02
  • Inventor: Akira IzumiMasamichi Ishihara
  • Applicant: Akira IzumiMasamichi Ishihara
  • Applicant Address: JP Fukuoka
  • Assignee: Kyushu Institute of Technology
  • Current Assignee: Kyushu Institute of Technology
  • Current Assignee Address: JP Fukuoka
  • Agency: McGlew and Tuttle, P.C.
  • Priority: JP2004-167891 20040607; JP2004-378965 20041228
  • International Application: PCT/JP2005/010223 WO 20050603
  • International Announcement: WO2005/122230 WO 20051222
  • Main IPC: H01L21/44
  • IPC: H01L21/44
Method for processing copper surface, method for forming copper pattern wiring and semiconductor device manufactured using such method
Abstract:
A gas inlet is disposed in a lower portion of a reaction chamber, a copper substrate is disposed in an upper portion thereof, and a tungsten catalytic body heated to 1600° C. is disposed midway between the two. Ammonia gas introduced from the gas inlet is decomposed by the tungsten catalytic body, a chemical species generated by the decomposition reacts with a surface of the copper substrate, and reduces and removes a contaminant on the copper surface, and a Cu3N thin film is formed on the copper substrate surface. This Cu3N film has the action of a film which prevents the oxidation of copper. This Cu3N film is thermally decomposed and removed when heated to temperatures of not less than 300° C., leaving a clean copper surface behind.
Information query
Patent Agency Ranking
0/0