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US07829638B2 Antireflective hardmask composition and methods for using same 有权
防反射硬掩模组​​合物及其使用方法

Antireflective hardmask composition and methods for using same
Abstract:
Hardmask compositions having antireflective properties useful in lithographic processes, methods of using the same, and semiconductor devices fabricated by such methods, are provided.
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