发明授权
- 专利标题: Semiconductor device and method of fabricating the same
- 专利标题(中): 半导体装置及其制造方法
-
申请号: US11966640申请日: 2007-12-28
-
公开(公告)号: US07829953B2公开(公告)日: 2010-11-09
- 发明人: Hyung Suk Jung , Jong-Ho Lee , Sung Kee Han , Ha Jin Lim
- 申请人: Hyung Suk Jung , Jong-Ho Lee , Sung Kee Han , Ha Jin Lim
- 申请人地址: KR Suwon-Si
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR Suwon-Si
- 代理机构: F. Chau & Associates, LLC
- 优先权: KR10-2007-0000279 20070102
- 主分类号: H01L29/72
- IPC分类号: H01L29/72
摘要:
A semiconductor device includes a semiconductor substrate including an NMOS region and a PMOS region, a gate insulating layer formed on the semiconductor substrate, an NMOS gate formed on the gate insulating layer of the NMOS region, and a PMOS gate formed on the gate insulating layer of the PMOS region. Any one of the NMOS gate and the PMOS gate includes a one-layered conductive layer pattern, and another of the NMOS gate and the PMOS gate includes a three-layered conductive layer pattern.
公开/授权文献
- US20080150036A1 SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME 公开/授权日:2008-06-26
信息查询
IPC分类: