发明授权
- 专利标题: Semiconductor device and method of fabricating the same
- 专利标题(中): 半导体装置及其制造方法
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申请号: US11931571申请日: 2007-10-31
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公开(公告)号: US07833875B2公开(公告)日: 2010-11-16
- 发明人: Jung-Hwan Kim , Hun-Hyeoung Leam , Tae-Hyun Kim , Seok-Woo Nam , Hyun Namkoong , Yong-Seok Kim , Tea-Kwang Yu
- 申请人: Jung-Hwan Kim , Hun-Hyeoung Leam , Tae-Hyun Kim , Seok-Woo Nam , Hyun Namkoong , Yong-Seok Kim , Tea-Kwang Yu
- 申请人地址: KR Suwon-Si, Gyeonggi-Do
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR Suwon-Si, Gyeonggi-Do
- 代理机构: F. Chau & Associates, LLC
- 优先权: KR10-2007-0038327 20070419
- 主分类号: H01L21/76
- IPC分类号: H01L21/76
摘要:
A semiconductor device includes an isolation layer defining an active region formed in a semiconductor substrate. A first recessing process is performed on the isolation layer to expose edge portions of the active region. A first rounding process is performed to round the edge portions of the active region. A second recessing process is performed on the isolation layer. A second rounding process is performed to round the edge portions of the active region.
公开/授权文献
- US20080057670A1 Semiconductor Device and Method of Fabricating the Same 公开/授权日:2008-03-06
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