发明授权
US07851363B2 Pattern forming method and manufacturing method of semiconductor device
有权
半导体器件的图案形成方法和制造方法
- 专利标题: Pattern forming method and manufacturing method of semiconductor device
- 专利标题(中): 半导体器件的图案形成方法和制造方法
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申请号: US11034975申请日: 2005-01-14
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公开(公告)号: US07851363B2公开(公告)日: 2010-12-14
- 发明人: Tomoyuki Takeishi , Hirokazu Kato , Shinichi Ito
- 申请人: Tomoyuki Takeishi , Hirokazu Kato , Shinichi Ito
- 申请人地址: JP Tokyo
- 专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人地址: JP Tokyo
- 代理机构: Finnegan, Henderson, Farabow, Garrett & Dunner, L.L.P.
- 优先权: JP2004-008290 20040115
- 主分类号: H01L21/311
- IPC分类号: H01L21/311
摘要:
A pattern forming method includes forming a spin on dielectric film on a substrate, washing the spin on dielectric film by using a washing liquid, drying a surface of the spin on dielectric film after the washing, forming a photosensitive film on the dried coating type insulation film, emitting energy rays to a predetermined position of the photosensitive film in order to form a latent image on the photosensitive film, developing the photosensitive film in order to form a photosensitive film pattern which corresponds to the latent image, and processing the spin on dielectric film with the photosensitive film pattern serving as a mask.
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