发明授权
- 专利标题： Techniques for logic built-in self-test diagnostics of integrated circuit devices
- 专利标题（中）： 逻辑内置自检诊断技术的集成电路设备
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申请号： US12061752申请日： 2008-04-03
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公开(公告)号： US07856582B2公开(公告)日： 2010-12-21
- 发明人: Daniel W. Cervantes , Robert B. Gass , Joshua P. Hernandez , Timothy M. Skergan
- 申请人： Daniel W. Cervantes , Robert B. Gass , Joshua P. Hernandez , Timothy M. Skergan
- 申请人地址： US NY Armonk
- 专利权人： International Business Machines Corporation
- 当前专利权人： International Business Machines Corporation
- 当前专利权人地址： US NY Armonk
- 代理机构： Dillon & Yudell LLP
- 主分类号： G01R31/28
- IPC分类号： G01R31/28 ; G01R31/02 ; G01R31/26
摘要：
A method, system and computer program product for performing real-time LBIST diagnostics of IC devices. During LBIST, stump data and identifiers of test cycles are saved in the IC device-under-test (DUT). If compressed stump data does not match a pre-defined coded value (i.e., “signature” of the test cycle), the saved stump data and an identifier of the failed test cycle are preserved, otherwise the determination is made the DUT passed the test cycle. Identifiers and stump of the failed test cycles are used to analyze errors, including virtually non-reproducible errors.
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