Invention Grant
- Patent Title: Unevenness detecting apparatus for compensating for threshold voltage and method thereof
- Patent Title (中): 用于补偿阈值电压的不均匀性检测装置及其方法
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Application No.: US11396951Application Date: 2006-04-03
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Publication No.: US07884810B2Publication Date: 2011-02-08
- Inventor: Jin Jang , Ji-Ho Hur , Se-Hwan Kim , Seung-Hyun Park
- Applicant: Jin Jang , Ji-Ho Hur , Se-Hwan Kim , Seung-Hyun Park
- Applicant Address: KR Seoul
- Assignee: Silicon Display Technology Co., Ltd.
- Current Assignee: Silicon Display Technology Co., Ltd.
- Current Assignee Address: KR Seoul
- Agency: Ladas & Parry LLP
- Priority: KR10-2005-0068515 20050727
- Main IPC: G06F3/045
- IPC: G06F3/045

Abstract:
Unevenness detecting apparatus for compensating for threshold voltage and method thereof is provided with a plurality of scan lines and a plurality of data lines and a pixel circuit arranged in each point which the scan lines and the data lines are intersected. The unevenness detecting apparatus for compensating for the threshold voltage and method thereof may accurately sense a state of minute unevenness such as fingerprints by using an active element (e.g., TFT) as an element of which pixel circuit is composed.
Public/Granted literature
- US20070024546A1 Unevenness detecting apparatus for compensating for threshold voltage and method thereof Public/Granted day:2007-02-01
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