Invention Grant
- Patent Title: Method and system for X-ray imaging
- Patent Title (中): X射线成像方法与系统
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Application No.: US12254732Application Date: 2008-10-20
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Publication No.: US07885375B2Publication Date: 2011-02-08
- Inventor: Bruno Kristiaan Bernard De Man , Daniel David Harrison , Maria Iatrou , Brian Patrick Smyth , Zhye Yin , Samit Kumar Basu , Souma Sengupta , Peter Claudius Sanza
- Applicant: Bruno Kristiaan Bernard De Man , Daniel David Harrison , Maria Iatrou , Brian Patrick Smyth , Zhye Yin , Samit Kumar Basu , Souma Sengupta , Peter Claudius Sanza
- Applicant Address: US NY Niskayuna
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Niskayuna
- Agent Jason K. Klindtworth
- Main IPC: G01N23/00
- IPC: G01N23/00

Abstract:
A technique is provided for imaging a field of view using an X-ray source comprising two or more emission points. The two or more emission points may be independently operated. Independent operation of the two or more emission points in performed in accordance with a list of commands that specifies the operation of the emission points. The list of commands, in one embodiment, is stored in a sequence buffer. In other embodiments, the list of commands is generated for a given usage, without being stored in a sequence buffer.
Public/Granted literature
- US20090161816A1 METHOD AND SYSTEM FOR X-RAY IMAGING Public/Granted day:2009-06-25
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