Invention Grant
- Patent Title: Integrated circuit with low-power built-in self-test logic
- Patent Title (中): 集成电路采用低功耗内置自检逻辑
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Application No.: US11418588Application Date: 2006-05-04
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Publication No.: US07895491B2Publication Date: 2011-02-22
- Inventor: Yuqian C. Wong
- Applicant: Yuqian C. Wong
- Assignee: Broadcom Corp.
- Current Assignee: Broadcom Corp.
- Agency: McAndrews, Held & Malloy, Ltd.
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G06F11/00
Abstract:
An integrated circuit with low-power built-in self-test logic (“IC-LPBIST”) is disclosed. The IC-LPBIST may include combinational logic and a loading circuit enabled to load a shift test pattern of data into the loading circuit without powering the combinational logic of the IC-LPBIST, wherein the shift test pattern of data is configured to test the combinational logic for logical faults.
Public/Granted literature
- US20070260954A1 Integrated circuit with low-power built-in self-test logic Public/Granted day:2007-11-08
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