发明授权
- 专利标题: Semiconductor device with speed performance measurement
- 专利标题(中): 具有速度性能测量的半导体器件
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申请号: US12335331申请日: 2008-12-15
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公开(公告)号: US07911221B2公开(公告)日: 2011-03-22
- 发明人: Masanao Yamaoka , Kenichi Osada
- 申请人: Masanao Yamaoka , Kenichi Osada
- 申请人地址: JP Kawasaki-shi
- 专利权人: Renesas Electronics Corporation
- 当前专利权人: Renesas Electronics Corporation
- 当前专利权人地址: JP Kawasaki-shi
- 代理机构: Miles & Stockbridge P.C.
- 优先权: JP2007-324991 20071217
- 主分类号: H03K19/00
- IPC分类号: H03K19/00
摘要:
A speed performance measurement circuit that may perform speed performance measurement is provided between a first logic circuit and a second logic circuit. The speed performance measurement circuit includes a first flip flop that stores first data, a first delay circuit that delays the first data and generates second data, and a second flip flop that stores the second data. Furthermore, the speed performance measurement circuit includes a first comparator circuit that compares output of the first flip flop to output of the second flip flop, and a third flip flop that stores output data from the first comparator circuit in accordance with timing of the first clock signal. Data in a normal path is compared to data in a path delayed by a certain time to measure speed, and power voltage of a circuit is determined based on such comparison. Thus, change in speed with respect to power voltage in a critical path can be measured.
公开/授权文献
- US20090153182A1 SEMICONDUCTOR DEVICE 公开/授权日:2009-06-18
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