Invention Grant
- Patent Title: Methods for forming patterns
- Patent Title (中): 形成图案的方法
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Application No.: US11834579Application Date: 2007-08-06
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Publication No.: US07919413B2Publication Date: 2011-04-05
- Inventor: Frederick T Chen
- Applicant: Frederick T Chen
- Applicant Address: TW Hsinchu
- Assignee: Industrial Technology Research Institute
- Current Assignee: Industrial Technology Research Institute
- Current Assignee Address: TW Hsinchu
- Main IPC: H01L21/311
- IPC: H01L21/311

Abstract:
A method for forming patterns comprises providing a substrate. A set of seed features is formed over the substrate. At least one bi-layer comprising a first layer followed by a second layer is formed on the set of seed features. The first layer and the second layer above the set of seed features are removed. The first layer and the second layer are anisotropically etched successively at least one time to form an opening next to the set of seed features.
Public/Granted literature
- US20090042391A1 METHODS FOR FORMING PATTERNS Public/Granted day:2009-02-12
Information query
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