Invention Grant
- Patent Title: Apparatus and method for measuring characteristics of surface features
- Patent Title (中): 用于测量表面特征特征的装置和方法
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Application No.: US11963693Application Date: 2007-12-21
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Publication No.: US07924435B2Publication Date: 2011-04-12
- Inventor: Xavier Colonna De Lega , Peter De Groot
- Applicant: Xavier Colonna De Lega , Peter De Groot
- Applicant Address: US CT Middlefield
- Assignee: Zygo Corporation
- Current Assignee: Zygo Corporation
- Current Assignee Address: US CT Middlefield
- Agency: Fish & Richardson P.C.
- Main IPC: G01B11/02
- IPC: G01B11/02

Abstract:
An apparatus is disclosed which includes an interferometry system configured to operate in a first mode to produce a first set of multiple interferometry signals corresponding to different illumination angles of a test object by test light and in a second mode produce a second set of multiple interferometry signals corresponding to different surface locations of a test object. An electronic processor coupled to the interferometry system is configured to receive the first set of interferometry signals and programmed to compare information derivable from the first set of multiple interferometry signals to information corresponding to multiple models of the test object to determine information related to one or features of the test object, and output the information. In some embodiments, the features include an under-resolved feature.
Public/Granted literature
- US20080174784A1 APPARATUS AND METHOD FOR MEASURING CHARACTERISTICS OF SURFACE FEATURES Public/Granted day:2008-07-24
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