发明授权
US07933150B2 Nonvolatile semiconductor memory device and programming method thereof 失效
非易失性半导体存储器件及其编程方法

Nonvolatile semiconductor memory device and programming method thereof
摘要:
A nonvolatile semiconductor memory device and a programming method thereof are provided. The programming method includes first programming a cell among a plurality of adjacent memory cells to the highest threshold voltage distribution corresponding to a data state, and subsequently programming the other adjacent cells to the lower threshold voltage distributions corresponding to second and third data states. The second data state and the third data state may have the second highest threshold voltage distribution and the third highest threshold voltage distribution, respectively, or the third highest threshold voltage distribution and the second highest threshold voltage distribution, respectively.
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