发明授权
- 专利标题: Microscope apparatus control method and microscope apparatus
- 专利标题(中): 显微镜装置控制方法及显微镜装置
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申请号: US11893823申请日: 2007-08-17
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公开(公告)号: US07945108B2公开(公告)日: 2011-05-17
- 发明人: Takayuki Kono , Akihiko Yoshikawa
- 申请人: Takayuki Kono , Akihiko Yoshikawa
- 申请人地址: JP Tokyo
- 专利权人: Olympus Corporation
- 当前专利权人: Olympus Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Holtz, Holtz, Goodman & Chick, PC
- 优先权: JP2006-241783 20060906
- 主分类号: G06K9/40
- IPC分类号: G06K9/40 ; G02B21/26 ; G01N21/76
摘要:
The present invention provides a control method for a microscope apparatus, comprising: a first step for recognizing a type of a specimen retention member retaining a specimen; a second step for obtaining a first image including the whole image of a specimen retention member showing a picture of the entirety of the specimen retention member and an image of the specimen, and obtaining a second image including only the whole image of the specimen retention member in accordance with the type of the specimen retention member; and a third step for obtaining a macro observation image with a self fluorescence removed except for the specimen based on the first image and second image.
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