Invention Grant
- Patent Title: Device for jitter measurement and method thereof
- Patent Title (中): 抖动测量装置及其方法
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Application No.: US12117176Application Date: 2008-05-08
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Publication No.: US07957923B2Publication Date: 2011-06-07
- Inventor: An-Sheng Chao , Soon-Jyh Chang , Chih-Haur Huang , Kuo-Chan Huang , Shih-Ming Luo
- Applicant: An-Sheng Chao , Soon-Jyh Chang , Chih-Haur Huang , Kuo-Chan Huang , Shih-Ming Luo
- Applicant Address: TW Tainan County TW Tainan
- Assignee: Himax Technologies Limited,NCKU Research & Development Foundation
- Current Assignee: Himax Technologies Limited,NCKU Research & Development Foundation
- Current Assignee Address: TW Tainan County TW Tainan
- Agency: J.C. Patents
- Main IPC: G06F19/00
- IPC: G06F19/00 ; H04B3/46

Abstract:
The device for jitter measurement and a method thereof are provided. The device for jitter measure includes a signal retrieving module, a signal amplifying module, an edge detecting module, and a time-to-digital converting module. The signal retrieving module receives a signal-under-test, and retrieves a first pulse signal having a pulse width equal to a period of the signal-under-test. The signal amplifying module amplifies the pulse width of the first pulse signal and thereby generates a second pulse signal. The edge detecting module detects a rising edge and a falling edge of the second pulse signal, and generates a first indication signal and a second indication signal according to the respective detected results. The time-to-digital converting module converts the pulse width of the second pulse signal existed in time domain to a digital signal according to the first indication signal and the second indication signal.
Public/Granted literature
- US20090112499A1 DEVICE FOR JITTER MEASUREMENT AND METHOD THEREOF Public/Granted day:2009-04-30
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