发明授权
- 专利标题: Fault diagnosis of compressed test responses
- 专利标题(中): 压缩测试响应的故障诊断
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申请号: US12405828申请日: 2009-03-17
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公开(公告)号: US07962820B2公开(公告)日: 2011-06-14
- 发明人: Janusz Rajski , Grzegorz Mrugalski , Artur Pogiel , Jerzy Tyszer , Chen Wang
- 申请人: Janusz Rajski , Grzegorz Mrugalski , Artur Pogiel , Jerzy Tyszer , Chen Wang
- 申请人地址: US OR Wilsonville
- 专利权人: Mentor Graphics Corporation
- 当前专利权人: Mentor Graphics Corporation
- 当前专利权人地址: US OR Wilsonville
- 代理机构: Klarquist Sparkman, LLP
- 主分类号: G01R31/3193
- IPC分类号: G01R31/3193 ; G01R31/40
摘要:
Methods, apparatus, and systems for diagnosing failing scan cells from compressed test responses are disclosed herein. For example, in one nonlimiting exemplary embodiment, at least one error signature comprising multiple bits (including one or more error bits) is received. Plural potential-error-bit-explaining scan cell candidates are evaluated using a search tree. A determination is made as to whether one or more of the evaluated scan cell candidates explain the error bits in the error signature and thereby constitute one or more failing scan cells. An output is provided of any such one or more failing scan cells determined. Tangible computer-readable media comprising computer-executable instructions for causing a computer to perform any of the disclosed methods are also provided. Tangible computer-readable media comprising lists of failing scan cells identified by any of the disclosed methods are also provided.
公开/授权文献
- US20090249147A1 FAULT DIAGNOSIS OF COMPRESSED TEST RESPONSES 公开/授权日:2009-10-01
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