-
公开(公告)号：US11635462B2
公开(公告)日：2023-04-25
申请号：US17004288
申请日：2020-08-27
发明人： Xijiang Lin , Wu-Tung Cheng , Takeo Kobayashi , Andreas Glowatz
IPC分类号： G01R31/00 , G01R31/317 , G01R31/3177
摘要： This application discloses a computing system implementing an automatic test pattern generation tool to convert a transistor-level model of a library cell describing a digital circuit into a switch-level model of the library cell, generate test patterns configured to enable detection of target defects injected into the switch-level model of the library cell, and bifurcate the test patterns into a first subset of the test patterns and a second set of the test patterns based on detection types for the target defects enabled by the test patterns. The computing system can implement a cell model generation tool to perform an analog simulation of the transistor-level model of the library cell using the second subset of the test patterns to verify that they enable detection of target defects, while skipping performance of the analog simulation of the transistor-level model of the library cell using the first subset of the test patterns.
-
公开(公告)号：US11126159B2
公开(公告)日：2021-09-21
申请号：US16738571
申请日：2020-01-09
发明人： Huikan Liu
IPC分类号： G05B99/00 , G05B19/4097 , G03F7/20
摘要： A system may include a model calibration engine configured to determine a candidate lithography model set from which to calibrate a lithography model according to multiple objectives, including by initializing a population of parent candidate models, generating child candidate models, merging the parent and child candidate models into a merged population, classifying the candidate models of the merged population into tiers of non-dominated fronts according to respective objective functions for the multiple objectives, determining a subset of the merged population based on the classified tiers, and identifying, as the candidate lithography model set, a Pareto-optimal front of the subset of the merged population determined based on the classified tiers. The system may also include a model selection engine configured to set a given candidate lithography model in the candidate lithography model set as a calibrated lithography model for simulating a lithographic process.
-
公开(公告)号：US11113445B2
公开(公告)日：2021-09-07
申请号：US16135236
申请日：2018-09-19
摘要： Aspects of the disclosed technology relate to techniques of hotspot detection. Pinching-type hotspot candidates and bridging-type hotspot candidates are first identified in the layout design based on predetermined criteria. Simulation is then performed to derive aerial image intensity values for a plurality of sites on each of the pinching-type and bridging-type hotspot candidates. Pinching-type hotspots are determined from the pinching-type hotspot candidates based on one or more machine learning models for pinching-type hotspots, and bridging-type hotspots are determined from the bridging-type hotspot candidates based on one or more machine learning models for bridging-type hotspots. The input vector for the machine learning models is the aerial image intensity values for the plurality of sites.
-
公开(公告)号：US11106848B2
公开(公告)日：2021-08-31
申请号：US17003138
申请日：2020-08-26
发明人： Wu-Tung Cheng , Szczepan Urban , Jakub Janicki , Manish Sharma , Yu Huang
IPC分类号： G06F30/333 , G06F11/08 , G06F11/27 , G06F11/26 , G01R31/28 , G01R31/3177 , G06F119/18 , G06F119/02 , G06F11/00
摘要： This application discloses a computing system implementing an automatic test pattern generation tool can generate test patterns to apply to a reversible scan chain in an integrated circuit. The reversible scan chain can be configured to serially load and unload the test patterns in multiple directions to generate test responses. The computing system can implement a defect diagnosis tool to detect a presence of a suspected defect associated with the reversible scan chain based on the test responses, identify which of the multiple directions used to load and unload the test patterns corresponds to the suspected defect in the reversible scan chain based on the test responses, and determine a portion of the integrated circuit to inspect for a manufacturing fault corresponding to the suspected defect based, at least in part, on the identification of which of the multiple directions corresponds to the suspected defect in the reversible scan chain.
-
公开(公告)号：US20210216059A1
公开(公告)日：2021-07-15
申请号：US16738571
申请日：2020-01-09
发明人： Huikan Liu
IPC分类号： G05B19/4097 , G03F7/20
摘要： A system may include a model calibration engine configured to determine a candidate lithography model set from which to calibrate a lithography model according to multiple objectives, including by initializing a population of parent candidate models, generating child candidate models, merging the parent and child candidate models into a merged population, classifying the candidate models of the merged population into tiers of non-dominated fronts according to respective objective functions for the multiple objectives, determining a subset of the merged population based on the classified tiers, and identifying, as the candidate lithography model set, a Pareto-optimal front of the subset of the merged population determined based on the classified tiers. The system may also include a model selection engine configured to set a given candidate lithography model in the candidate lithography model set as a calibrated lithography model for simulating a lithographic process.
-
公开(公告)号：US11023644B1
公开(公告)日：2021-06-01
申请号：US16997312
申请日：2020-08-19
IPC分类号： G06F30/392 , G06F30/398 , G06F30/33
摘要： This application discloses a computing system implementing an optical proximity correction model calibration tool to determine parameters for gauges describing features of an integrated circuit. The gauges include values corresponding to measurements collected for a set of the features. The optical proximity correction model calibration tool can ascertain densities of the gauges based on the measurements associated with the parameters for the gauges, and set weights for the gauges based, at least in part, on the densities. The optical proximity correction model calibration tool can calibrate an optical proximity correction (OPC) model using the weights for the gauges. The OPC model calibrated with the weights of the gauges can be utilized to predict of a printed image on a substrate described by a mask layout design corresponding to the integrated circuit.
-
公开(公告)号：US11017139B1
公开(公告)日：2021-05-25
申请号：US16828642
申请日：2020-03-24
发明人： Pritam Roy , Sagar Chaki , Pankaj Chauhan
IPC分类号： G06F30/3323 , G06F30/3308 , G06F119/16
摘要： This application discloses a computing system to select a set of one or more values for control signals internal to multiple circuit designs, generate input stimulus for the circuit designs based, at least in part, on the selected set of values for the control signals, and simulate the circuit designs with the input stimulus, which configures the simulated values of the control signals internal to the circuits designs to the selected set of values. The computing system can perform an equivalence check on the circuit designs using results of the simulation. The computing system can select another set of values for the control signals, and determine that at least the other set of values for the control signals are not realizable during simulation with any input stimulus.
-
公开(公告)号：US10996680B2
公开(公告)日：2021-05-04
申请号：US16237365
申请日：2018-12-31
发明人： Amin Kashi , Glenn Perry , Ohad Barak , Nizar Sallem
IPC分类号： G05D1/02 , G01S15/931 , G07C5/08 , G10K11/178 , G06K9/00
摘要： This application discloses sensors to capture audio measurement in an environment around a vehicle and a computing system to classify audio measurements captured with one or more sensors mounted to a vehicle, wherein the classified audio measurements identify to a type of object in an environment around the vehicle, and fuse the classified audio measurements with measurements captured by at least one different type of sensor to detect the object in the environment around the vehicle, wherein a control system for the vehicle is configured to control operation of the vehicle based, at least in part, on the detected object. The computing system can also identify noise in the captured audio measurements originating from the vehicle and utilize the identified noise to detect faults in the vehicle, to perform proximity detection around the vehicle, or to perform noise cancelation operations in the vehicle.
-
公开(公告)号：US10977400B2
公开(公告)日：2021-04-13
申请号：US16548172
申请日：2019-08-22
发明人： Wu-Tung Cheng , Kun-Han Tsai , Naixing Wang , Chen Wang , Xijiang Lin , Mark A. Kassab , Irith Pomeranz
IPC分类号： G06F30/30 , G06F119/12
摘要： Systems and methods for a deterministic automatic test generation (ATPG) process including Timing Exception ATPG (TEA). A method includes performing an automated test pattern generation (ATPG) process that uses timing exception information to generate a test pattern for a targeted fault of a circuit design with at least one timing exception path. The method includes testing the targeted fault of the circuit design using the test pattern to produce a test result for the targeted fault.
-
10.发明授权公开(公告)号：US10929582B2
公开(公告)日：2021-02-23
申请号：US16089408
申请日：2017-03-31
发明人： Michael Alam
IPC分类号： G06F30/33 , G06F30/367 , G06F30/347 , G06F30/333 , G06F11/26
摘要： Circuits may be designed using computer aided design tools and may comprise a plurality of different possible variants of individual components. These multi-variant component circuits may be validated to identify potential problems by generating an aggregate parametric model for the multi-variant components and then using the aggregate parametric model in applying tests to different connection networks of the circuit definition.
-
-
-
-
-
-
-
-
-
搜索结果
1087 条记录 (耗时 0.03 秒)
