Invention Grant
- Patent Title: Film formation method and apparatus for semiconductor process
- Patent Title (中): 用于半导体工艺的成膜方法和装置
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Application No.: US11892948Application Date: 2007-08-28
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Publication No.: US07964241B2Publication Date: 2011-06-21
- Inventor: Kazuhide Hasebe , Pao-Hwa Chou , Kota Umezawa , Kentaro Kadonaga , Hao-Hsiang Chang
- Applicant: Kazuhide Hasebe , Pao-Hwa Chou , Kota Umezawa , Kentaro Kadonaga , Hao-Hsiang Chang
- Applicant Address: JP Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Tokyo
- Agency: Smith, Gambrell & Russell, LLP
- Priority: JP2006-237558 20060901
- Main IPC: C23C16/00
- IPC: C23C16/00

Abstract:
An insulating film is formed on a target substrate by CVD, in a process field to be selectively supplied with a first process gas containing a silane family gas, a second process gas containing a nitriding gas or oxynitriding gas, a third process gas containing a boron-containing gas, and a fourth process gas containing a carbon hydride gas. A first step performs supply of the first process gas and a preceding gas, which is one of the third and fourth process gases, while stopping supply of the second process gas and a succeeding gas, which is the other of the third and fourth process gases. A second step performs supply of the succeeding gas, while stopping supply of the second process gas and the preceding gas. A third step performs supply of the second process gas while stopping supply of the first process gas.
Public/Granted literature
- US20080063791A1 Film formation method and apparatus for semiconductor process Public/Granted day:2008-03-13
Information query
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