发明授权
- 专利标题: Methods of forming a pattern of a semiconductor device
- 专利标题(中): 形成半导体器件的图案的方法
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申请号: US12339863申请日: 2008-12-19
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公开(公告)号: US07964332B2公开(公告)日: 2011-06-21
- 发明人: Hyo-Jin Yun , Young-Ho Kim , Boo-Deuk Kim , Ji-Man Park , Jin-A Ryu , Jae-Hee Choi
- 申请人: Hyo-Jin Yun , Young-Ho Kim , Boo-Deuk Kim , Ji-Man Park , Jin-A Ryu , Jae-Hee Choi
- 申请人地址: KR Suwon-Si
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR Suwon-Si
- 代理机构: F. Chau & Associates, LLC
- 优先权: KR10-2007-0134060 20071220
- 主分类号: G03F7/00
- IPC分类号: G03F7/00 ; G03F7/004 ; G03F7/11 ; G03F7/26
摘要:
In polymers for an anti-reflective coating, compositions for an anti-reflective coating and methods of forming a pattern of a semiconductor device using the same, the compositions for an anti-reflective coating include a polymer that includes a first repeating unit having a basic side group, a second repeating unit having a light-absorbing group, and a third repeating unit having a cross-linkable group; a photoacid generator; a cross-linking agent; and a solvent. The polymer for the anti-reflective coating, which may have a basic side group chemically bound to a backbone of the polymer, may properly adjust diffusion of an acid in an anti-reflective coating layer to improve the profile of a pattern.
公开/授权文献
- US20090162796A1 METHODS OF FORMING A PATTERN OF A SEMICONDUCTOR DEVICE 公开/授权日:2009-06-25
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