Invention Grant
- Patent Title: Bonding apparatus and wire bonding method
- Patent Title (中): 接合装置和引线接合方法
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Application No.: US12794911Application Date: 2010-06-07
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Publication No.: US07975901B2Publication Date: 2011-07-12
- Inventor: Toru Maeda , Tetsuya Utano , Akinobu Teramoto
- Applicant: Toru Maeda , Tetsuya Utano , Akinobu Teramoto
- Applicant Address: JP Tokyo JP Miyagi
- Assignee: Shinkawa Ltd.,Tohoku University
- Current Assignee: Shinkawa Ltd.,Tohoku University
- Current Assignee Address: JP Tokyo JP Miyagi
- Agency: Katten Muchin Rosenman LLP
- Priority: JP2007-317518 20071207
- Main IPC: B23K31/02
- IPC: B23K31/02 ; B23K37/00 ; C23F1/00

Abstract:
A bonding apparatus including a chamber for maintaining an inert gas atmosphere; a first plasma torch for performing a surface treatment on pads and electrodes, the first plasma torch being attached in the chamber, to apply gas plasma to a substrate and a semiconductor chip that is placed inside the chamber; a second plasma torch for performing a surface treatment on an initial ball and/or wire at a tip end of a capillary that is positioned inside the chamber, the second plasma torch being attached in the chamber, to apply gas plasma to the initial ball and/or wire; and a bonding unit for bonding the surface-treated initial ball and/or wire to the surface-treated pads and electrodes in the chamber, thereby cleaning of the surface of the electrodes and pads as well as the wire can be effectively performed.
Public/Granted literature
- US20100294435A1 BONDING APPARATUS AND WIRE BONDING METHOD Public/Granted day:2010-11-25
Information query
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