发明授权
US07977636B2 Infrared imaging using thermal radiation from a scanning probe tip
有权
使用来自扫描探头的热辐射的红外成像
- 专利标题： Infrared imaging using thermal radiation from a scanning probe tip
- 专利标题（中）： 使用来自扫描探头的热辐射的红外成像
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申请号： US12228539申请日： 2008-08-12
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公开(公告)号： US07977636B2公开(公告)日： 2011-07-12
- 发明人: Markus B. Raschke
- 申请人： Markus B. Raschke
- 申请人地址： US CA Santa Barbara
- 专利权人： Anasys Instruments, Inc.
- 当前专利权人： Anasys Instruments, Inc.
- 当前专利权人地址： US CA Santa Barbara
- 代理商 Mark Rodgers
- 主分类号： G01J5/02
- IPC分类号： G01J5/02
摘要：
A method for performing sub-micron optical spectroscopy, using a heated SPM probe and far-field collection optics is described. The enhanced emission characteristics at a sharp heated tip constitute a highly localized wideband IR source. Thus the IR absorption and emission properties of a sample surface adjacent can be observed and measured in the farfield even though the interaction region is sub-micron in scale. . . . providing spatial resolution mapping of sample composition.
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