A test card system for use in product development includes a device under test (DUT). The DUT comprises: a mount plane; a power input port coupled to the mount plane; a JTAG input port coupled to the mount plane; a clock signal distribution network coupled to the JTAG input port; a plurality of latches coupled to the clock signal distribution network and the power input port; and an output port coupled to the plurality of latches. A test card (TC) couples to the DUT, comprising: a JTAG interface coupled to the DUT JTAG input port and configured to provide test data to the DUT; a clock module coupled to the DUT clock signal distribution network and configured to generate a clock signal; and an analysis module coupled to the DUT output port and configured to receive data from the DUT.