发明授权
- 专利标题: Method of programming memory device
- 专利标题(中): 编程存储器件的方法
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申请号: US12213323申请日: 2008-06-18
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公开(公告)号: US08000150B2公开(公告)日: 2011-08-16
- 发明人: Kwang-soo Seol , Sang-jin Park
- 申请人: Kwang-soo Seol , Sang-jin Park
- 申请人地址: KR Gyeonggi-do
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR Gyeonggi-do
- 代理机构: Harness, Dickey & Pierce, PLC
- 优先权: KR10-2007-0060052 20070619; KR10-2008-0045520 20080516
- 主分类号: G11C11/34
- IPC分类号: G11C11/34
摘要:
A method of programming a memory device may include applying a program voltage to a memory cell of the memory device and consecutively applying a plurality of verifying voltages to the memory cell. The verifying voltages may be consecutively applied with a same voltage magnitude after applying the program voltage. The verifying voltages may be consecutively applied with sequentially decreasing magnitudes after applying the program voltage.
公开/授权文献
- US20080316820A1 Method of programming memory device 公开/授权日:2008-12-25
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