Invention Grant
- Patent Title: Film formation apparatus for semiconductor process and method for using the same
- Patent Title (中): 用于半导体工艺的成膜装置及其使用方法
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Application No.: US11822979Application Date: 2007-07-11
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Publication No.: US08025931B2Publication Date: 2011-09-27
- Inventor: Pao-Hwa Chou , Kazuhide Hasebe
- Applicant: Pao-Hwa Chou , Kazuhide Hasebe
- Applicant Address: JP Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Tokyo
- Agency: Smith, Gambrell & Russell, LLP
- Priority: JP2006-192991 20060713
- Main IPC: C23C16/00
- IPC: C23C16/00

Abstract:
A method for using a film formation apparatus performs a first film formation process, while supplying a first film formation gas into a process field inside a process container, thereby forming a first thin film on a first target substrate inside the process field. After unloading the first target substrate from the process container, the method performs a cleaning process of an interior of the process container, while supplying a cleaning gas into the process field, and generating plasma of the cleaning gas by an exciting mechanism. Then, the method performs a second film formation process, while supplying a second film formation gas into the process field, thereby forming a second thin film on a target substrate inside the process field. The second film formation process is a plasma film formation process that generates plasma of the second film formation gas by the exciting mechanism.
Public/Granted literature
- US20080014758A1 Film formation apparatus for semiconductor process and method for using the same Public/Granted day:2008-01-17
Information query
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