发明授权
- 专利标题: Concave-convex surface inspection apparatus
- 专利标题(中): 凹凸表面检查装置
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申请号: US12400140申请日: 2009-03-09
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公开(公告)号: US08049868B2公开(公告)日: 2011-11-01
- 发明人: Masataka Toda , Toshihiko Yoshikawa , Katsuya Inuzuka , Koji Kuno
- 申请人: Masataka Toda , Toshihiko Yoshikawa , Katsuya Inuzuka , Koji Kuno
- 申请人地址: JP Kariya-shi
- 专利权人: Aisin Seiki Kabushiki Kaisha
- 当前专利权人: Aisin Seiki Kabushiki Kaisha
- 当前专利权人地址: JP Kariya-shi
- 代理机构: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- 优先权: JP2008-064458 20080313
- 主分类号: G01C3/08
- IPC分类号: G01C3/08 ; G01N21/00
摘要:
A concave-convex surface inspection apparatus includes a slit light source unit emitting a slit light to a concave-convex surface of an object to be inspected, an image-taking unit taking an image of the concave-convex surface illuminated by the emitted slit light with an imaging optical axis intersecting with an optical axis of the slit light with a narrow-angle equal to or narrower than 30 degrees, and an evaluation section obtaining a three dimensional shape of the concave-convex surface and evaluating the obtained three dimensional shape, wherein the slit light source unit includes a slit light source and a cylindrical lens, the image-taking unit includes a telecentric lens unit, an image-taking section having an imaging surface tilted relative to the imaging optical axis for increasing a focusing range of the concave-convex surface, and a P polarizer.
公开/授权文献
- US20090231570A1 CONCAVE-CONVEX SURFACE INSPECTION APPARATUS 公开/授权日:2009-09-17
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