公开(公告)号：US08049868B2

公开(公告)日：2011-11-01

申请号：US12400140

申请日：2009-03-09

申请人： Masataka Toda ,  Toshihiko Yoshikawa ,  Katsuya Inuzuka ,  Koji Kuno

发明人： Masataka Toda ,  Toshihiko Yoshikawa ,  Katsuya Inuzuka ,  Koji Kuno

IPC分类号： G01C3/08 ,  G01N21/00

CPC分类号： G01B11/25

摘要： A concave-convex surface inspection apparatus includes a slit light source unit emitting a slit light to a concave-convex surface of an object to be inspected, an image-taking unit taking an image of the concave-convex surface illuminated by the emitted slit light with an imaging optical axis intersecting with an optical axis of the slit light with a narrow-angle equal to or narrower than 30 degrees, and an evaluation section obtaining a three dimensional shape of the concave-convex surface and evaluating the obtained three dimensional shape, wherein the slit light source unit includes a slit light source and a cylindrical lens, the image-taking unit includes a telecentric lens unit, an image-taking section having an imaging surface tilted relative to the imaging optical axis for increasing a focusing range of the concave-convex surface, and a P polarizer.

摘要翻译： 凹凸表面检查装置包括将狭缝光发射到被检查物体的凹凸面的狭缝光源单元，摄像单元拍摄由发射的狭缝光照射的凹凸面的图像 具有与狭缝等于或小于30度的狭缝光的光轴相交的成像光轴和获得凹凸表面的三维形状的评估部分，并评估所获得的三维形状， 其中所述狭缝光源单元包括狭缝光源和柱面透镜，所述摄像单元包括远心透镜单元，摄像部分具有相对于成像光轴倾斜的成像表面，用于增加所述摄像部分的聚焦范围 凹凸表面和P偏振器。

公开(公告)号：US20090231570A1

公开(公告)日：2009-09-17

申请号：US12400140

申请日：2009-03-09

申请人： Masataka Toda ,  Toshihiko Yoshikawa ,  Katsuya Inuzuka ,  Koji Kuno

发明人： Masataka Toda ,  Toshihiko Yoshikawa ,  Katsuya Inuzuka ,  Koji Kuno

IPC分类号： G01C3/00

CPC分类号： G01B11/25

摘要： A concave-convex surface inspection apparatus includes a slit light source unit emitting a slit light to a concave-convex surface of an object to be inspected, an image-taking unit taking an image of the concave-convex surface illuminated by the emitted slit light with an imaging optical axis intersecting with an optical axis of the slit light with a narrow-angle equal to or narrower than 30 degrees, and an evaluation section obtaining a three dimensional shape of the concave-convex surface and evaluating the obtained three dimensional shape, wherein the slit light source unit includes a slit light source and a cylindrical lens, the image-taking unit includes a telecentric lens unit, an image-taking section having an imaging surface tilted relative to the imaging optical axis for increasing a focusing range of the concave-convex surface, and a P polarizer.

摘要翻译： 凹凸表面检查装置包括将狭缝光发射到被检查物体的凹凸面的狭缝光源单元，摄像单元拍摄由发射的狭缝光照射的凹凸面的图像 具有与狭缝等于或小于30度的狭缝光的光轴相交的成像光轴和获得凹凸表面的三维形状的评估部分，并评估所获得的三维形状， 其中所述狭缝光源单元包括狭缝光源和柱面透镜，所述摄像单元包括远心透镜单元，摄像部分具有相对于成像光轴倾斜的成像表面，用于增加所述摄像部分的聚焦范围 凹凸表面和P偏振器。

公开(公告)号：US20110193952A1

公开(公告)日：2011-08-11

申请号：US13018817

申请日：2011-02-01

申请人： Akira KOZAKAI ,  Masataka Toda ,  Koji Kuno

发明人： Akira KOZAKAI ,  Masataka Toda ,  Koji Kuno

IPC分类号： G06K9/00 ,  H04N7/18

CPC分类号： G01N21/8851 ,  G01N21/474 ,  G01N21/8806 ,  G01N21/95 ,  G01N2021/8918

摘要： A defect detection apparatus, detecting a defect on an inspection surface of an inspection object, includes a table including a table surface, a lighting device emitting a light to the inspection surface, an image capturing device capturing an image of the inspection surface, a displacement mechanism changing a direction of at least of one of a relative direction of an optical axis of the lighting device relative to the table surface and a relative direction of an optical axis of the image capturing device relative to the table surface, an image data obtaining portion obtaining an image data from images captured by the image capturing device while changing the relative direction, a feature extracting portion extracting a feature representing a reflection characteristic of the inspection surface from the image data, and a defect specification portion specifying a type of the defect on the inspection surface based on the extracted feature.

摘要翻译： 一种检测检查对象的检查面上的缺陷的缺陷检测装置，包括：台面，向检查面发射光的照明装置，摄像检查面的图像的摄像装置，位移 改变照明装置的光轴相对于台面的相对方向和摄像装置相对于台面的相对方向中的至少一个的方向的机构，图像数据取得部 在改变相对方向的同时从图像捕获装置拍摄的图像中获取图像数据，从图像数据中提取表示检查表面的反射特性的特征的特征提取部分，以及指定缺陷类型的缺陷指定部分 基于提取的特征的检查表面。

公开(公告)号：US5897509A

公开(公告)日：1999-04-27

申请号：US880677

申请日：1997-06-23

申请人： Masataka Toda ,  Hiroyuki Suganuma ,  Shiro Yamazaki ,  Koji Kuno

发明人： Masataka Toda ,  Hiroyuki Suganuma ,  Shiro Yamazaki ,  Koji Kuno

IPC分类号： A61C19/04 ,  A61B5/103

CPC分类号： A61C19/043

摘要： A probe for measuring a depth of a periodontal pocket includes an emitting device for emitting, from a position at a distance from the periodontal pocket, a light beam toward the periodontal pocket, a receiving device for receiving, at a position at another distance from the periodontal pocket, the light beam after being reflected on a bottom of the periodontal pocket, and an analyzing device for displaying the depth of the periodontal pocket after a calculation thereof on the basis of an analysis of the light beam received at the receiving device.

摘要翻译： 用于测量牙周袋深度的探针包括一个发射装置，用于从与牙周袋一定距离处的一个位置发射朝向牙周袋的光束;一个接收装置，用于在与 在牙周袋的底部反射后的光束，以及分析装置，用于根据在接收装置接收的光束的分析，计算出牙周袋的深度。

公开(公告)号：US08451878B2

公开(公告)日：2013-05-28

申请号：US13312044

申请日：2011-12-06

申请人： Masaru Hisanaga ,  Masataka Toda ,  Toshihiko Yoshikawa

发明人： Masaru Hisanaga ,  Masataka Toda ,  Toshihiko Yoshikawa

IPC分类号： H01S5/00 ,  H01S5/40 ,  H01S5/022

CPC分类号： H01S5/005 ,  G01B11/25 ,  H01S5/02248 ,  H01S5/4025

摘要： A surface profile inspection device producing a sheet of light propagating in a linear region forming a plane from a laser beam emitted from a laser light source and irradiating the sheet of light to an object to be measured, and including an image capturing unit capturing an image of the object to be measured and a configuration data generating unit extracting a light section line defined by an irradiation of the sheet of light from image data of the captured image and generating surface profile data of the object to be measured. The laser light source includes a semiconductor laser emitting a laser beam from a light emitting layer formed in a linear direction along a boarder of a p-n junction. An attitude of the semiconductor laser is set to arrange the linear direction to be unparallel to a spread direction of the sheet of light.

摘要翻译： 一种表面轮廓检查装置，其产生在从激光光源发射的激光束形成平面的直线区域中传播的光束，并将光束照射到被测量物体，并且包括拍摄图像的图像捕获单元 以及配置数据生成单元，从拍摄图像的图像数据中提取由照射光束而定义的光截面线，并生成被测量物体的表面轮廓数据。 该激光源包括从p-n结的边缘沿着线性方向形成的发光层发射激光的半导体激光器。 半导体激光器的姿态被设定为使线性方向与光束的扩展方向不平行。

公开(公告)号：US5463697A

公开(公告)日：1995-10-31

申请号：US101734

申请日：1993-08-04

申请人： Masataka Toda ,  Hiroyuki Suganuma

发明人： Masataka Toda ,  Hiroyuki Suganuma

IPC分类号： G01B11/00 ,  G01B11/24 ,  G06T5/00 ,  G06K9/48

CPC分类号： G06T7/0083

摘要： A method of processing an image takes a picture of an object by CCD camera, and calculates a center position of an edge of the image of the object formed on an image field to determine the size of the object. A differential between picture elements is formed from image data to detect an edge region. A differential for each picture element located with the edge region is converted into an edge existence width estimate which is centered about the associated picture element and into an edge probability estimate that that picture element is an edge center. These estimates are used to weight the x position of the respective picture element in the edge region. A center x position Ejcp of an assemblage of weighted positions of all the picture elements in the edge region is calculated and is defined to be the center of the edge region.

摘要翻译： 处理图像的方法通过CCD照相机拍摄对象的图像，并计算形成在图像场上的对象的图像的边缘的中心位置，以确定对象的大小。 图像元素之间的差分由图像数据形成，以检测边缘区域。 将与边缘区域相对应的每个图像元素的差分转换成以关联的图像元素为中心的边缘存在宽度估计，并将其转换为该图像元素是边缘中心的边缘概率估计。 这些估计用于对边缘区域中的各个像素的x位置进行加权。 计算边缘区域中所有像素的加权位置的组合的中心x位置Ejcp，并将其定义为边缘区域的中心。