发明授权
US08090965B1 System and method for testing memory power management modes in an integrated circuit 失效
在集成电路中测试存储器电源管理模式的系统和方法

  • 专利标题: System and method for testing memory power management modes in an integrated circuit
  • 专利标题(中): 在集成电路中测试存储器电源管理模式的系统和方法
  • 申请号: US12104996
    申请日: 2008-04-17
  • 公开(公告)号: US08090965B1
    公开(公告)日: 2012-01-03
  • 发明人: Sreejit Chakravarty
  • 申请人: Sreejit Chakravarty
  • 申请人地址: US CA Milpitas
  • 专利权人: LSI Corporation
  • 当前专利权人: LSI Corporation
  • 当前专利权人地址: US CA Milpitas
  • 主分类号: G06F1/00
  • IPC分类号: G06F1/00 G06F1/26 G06F1/32 G06F11/00
System and method for testing memory power management modes in an integrated circuit
摘要:
A memory controller, a method of testing memory power management modes in an integrated circuit and an integrated circuit. In one embodiment, the memory controller includes a power management mode test controller couplable to a test access port and at least one memory core and configured to respond to a signal provided via the test access port by providing an ordered signal-setting sequence to the at least one memory core to cause the at least one memory core to enter into and exit from at least one memory power management mode.
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