发明授权
US08092702B2 Method of multi-stage substrate etching and terahertz oscillator manufactured using the same method
有权
使用相同方法制造的多级衬底蚀刻方法和太赫兹振荡器
- 专利标题: Method of multi-stage substrate etching and terahertz oscillator manufactured using the same method
- 专利标题(中): 使用相同方法制造的多级衬底蚀刻方法和太赫兹振荡器
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申请号: US12025186申请日: 2008-02-04
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公开(公告)号: US08092702B2公开(公告)日: 2012-01-10
- 发明人: Chan Wook Baik , Jong Seok Kim , Seong Chan Jun , Sun Il Kim , Jong Min Kim , Chan Bong Jun , Sang Hun Lee
- 申请人: Chan Wook Baik , Jong Seok Kim , Seong Chan Jun , Sun Il Kim , Jong Min Kim , Chan Bong Jun , Sang Hun Lee
- 申请人地址: KR
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR
- 代理机构: Cantor Colburn LLP
- 优先权: KR10-2007-0074593 20070725
- 主分类号: B44C1/22
- IPC分类号: B44C1/22
摘要:
A method of multi-stage substrate etching and a terahertz oscillator manufactured by using the method are provided. The method comprises the steps of forming a first mask pattern on any one surface of a first substrate, forming a hole by etching the first substrate using the first mask pattern as an etching mask, bonding, to the first substrate, a second substrate having the same thickness as a depth to be etched, forming a second mask pattern on the second substrate bonded, forming a hole by etching the second substrate using the second mask pattern as an etching mask, and removing an oxide layer having the etching selectivity between the first substrate and the second substrate, whereby the etched bottom is made uniformly even in a deep step, the edge curvature is minimized, and a T-shape is prevented from being formed on the etched wall face to thereby improve the etching quality. Further, the etching depth is previously controlled by lapping or polishing, the upper and lower substrates are precisely boned to each other using the alignment key, and a multi-layer processing is possibly performed thereto, so that the precision and the uniformity in structure of the oscillator or amplifier is obtained.
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