发明授权
US08097120B2 Process tuning gas injection from the substrate edge 有权
从基板边缘处理调整气体注入

Process tuning gas injection from the substrate edge
摘要:
Broadly speaking, the embodiments of the present invention provides an improved plasma processing mechanism, apparatus, and method to increase the process uniformity at the very edge of the substrate. In one embodiment, a plasma processing chamber comprises a substrate support configured to receive a substrate, and a plurality of tuning gas injection holes surrounding the edge of the substrate, wherein the tuning gas injection holes supplies a tuning gas to the edge of the substrate during plasma processing of the substrate.
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