Invention Grant
- Patent Title: Method of manufacturing ceramic probe card
- Patent Title (中): 陶瓷探针卡的制造方法
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Application No.: US12397923Application Date: 2009-03-04
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Publication No.: US08114303B2Publication Date: 2012-02-14
- Inventor: Ho Joon Park , Byeung Gyu Chang , Hee Ju Son , Sang Jin Kim
- Applicant: Ho Joon Park , Byeung Gyu Chang , Hee Ju Son , Sang Jin Kim
- Applicant Address: KR Gyunggi-do
- Assignee: Samsung Electro-Mechanics Co., Ltd.
- Current Assignee: Samsung Electro-Mechanics Co., Ltd.
- Current Assignee Address: KR Gyunggi-do
- Agency: McDermott Will & Emery LLP
- Priority: KR10-2008-0076530 20080805
- Main IPC: H01B13/00
- IPC: H01B13/00

Abstract:
Provided is a method of manufacturing a ceramic probe card. A ceramic laminated body having a plurality of ceramic green sheets and an interlayer circuit including a conductive via and a conductive line formed in the plurality of ceramic green sheets is prepared. Then, at least one probe pin structure connected to the interlayer circuit is formed by selectively removing the plurality of photosensitive ceramic sheets having a ceramic powder and a photosensitive organic component on the ceramic laminated body necessarily, and by filling a metal material in a region from which the plurality of photosensitive ceramic sheets have been removed. Then, a ceramic substrate having the at least one probe pin structure is provided by simultaneously firing the ceramic laminated body and the photosensitive ceramic sheets, and by removing the photosensitive ceramic sheets.
Public/Granted literature
- US20100032407A1 METHOD OF MANUFACTURING CERAMIC PROBE CARD Public/Granted day:2010-02-11
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