发明授权
- 专利标题: Dual gate layout for thin film transistor
- 专利标题(中): 薄膜晶体管的双栅极布局
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申请号: US13026453申请日: 2011-02-14
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公开(公告)号: US08115209B2公开(公告)日: 2012-02-14
- 发明人: Wein-Town Sun , Chun-Sheng Li , Jian-Shen Yu
- 申请人: Wein-Town Sun , Chun-Sheng Li , Jian-Shen Yu
- 申请人地址: TW Hsinchu
- 专利权人: Au Optronics Corp.
- 当前专利权人: Au Optronics Corp.
- 当前专利权人地址: TW Hsinchu
- 代理机构: Thomas, Kayden, Horstemeyer & Risley, LLP
- 优先权: TW92107167A 20030328
- 主分类号: H01L29/04
- IPC分类号: H01L29/04 ; H01L29/15 ; H01L31/036 ; H01L29/10 ; H01L31/0376 ; H01L31/20 ; H01L29/76 ; H01L31/112 ; H01L27/108 ; H01L29/12 ; H01L31/062 ; H01L31/113 ; H01L31/00
摘要:
A dual gate layout of a thin film transistor of liquid crystal display to alleviate dark current leakage is disclosed. The layout includes (1) a polysilicon on a substrate having a L-shaped or a snake shaped from top-view, which has a heavily doped source region, a first lightly doped region, a first gate channel, a second lightly doped region, a second gate channel, a third lightly doped region and a heavily doped drain region formed in order therein; (2) a gate oxide layer formed on the polysilicon layer and the substrate, (3) a gate metal layer then formed on the gate oxide layer having a scanning line and an extension portion with a L-shaped or an I-shaped. The gate metal intersects with the polysilicon layer thereto define the forgoing gate channels. Among of gate channels, at least one is along the signal line, which is connected to the source region through a source contact.
公开/授权文献
- US20110133200A1 Dual Gate Layout for Thin Film Transistor 公开/授权日:2011-06-09
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