Invention Grant
- Patent Title: Methods and apparatus for analyzing samples and collecting sample fractions
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Application No.: US12529477Application Date: 2008-12-04
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Publication No.: US08115930B2Publication Date: 2012-02-14
- Inventor: James M. Anderson, Jr. , Raaidah B. Saari-Nordhaus , Washington J. Mendoza , Josef P. Bystron , Dirk Helgemo , Sheldon Nelson , Bruce D. Black , Neil R. Picha , Dennis K. Mc Creary , Carl H. Poppe
- Applicant: James M. Anderson, Jr. , Raaidah B. Saari-Nordhaus , Washington J. Mendoza , Josef P. Bystron , Dirk Helgemo , Sheldon Nelson , Bruce D. Black , Neil R. Picha , Dennis K. Mc Creary , Carl H. Poppe
- Applicant Address: US MD Columbia
- Assignee: Alltech Associates, Inc.
- Current Assignee: Alltech Associates, Inc.
- Current Assignee Address: US MD Columbia
- Agent William D. Bunch
- International Application: PCT/US2008/013359 WO 20081204
- International Announcement: WO2009/075764 WO 20090618
- Main IPC: G01N21/00
- IPC: G01N21/00
Abstract:
Methods and apparatus for analyzing a sample using at least one detector are disclosed.
Public/Granted literature
- US20100238444A1 METHODS AND APPARATUS FOR ANALYZING SAMPLES AND COLLECTING SAMPLE FRACTIONS Public/Granted day:2010-09-23
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