Invention Grant
- Patent Title: Method and system for identifying defects in NDT image data
- Patent Title (中): 识别NDT图像数据缺陷的方法和系统
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Application No.: US12118895Application Date: 2008-05-12
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Publication No.: US08131107B2Publication Date: 2012-03-06
- Inventor: Zhaohui Sun , Ali Can , John Charles Janning , Robert August Kaucic , Paulo Ricardo Mendonca , Joseph Manuel Portaz
- Applicant: Zhaohui Sun , Ali Can , John Charles Janning , Robert August Kaucic , Paulo Ricardo Mendonca , Joseph Manuel Portaz
- Applicant Address: US NY Niskayuna
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Niskayuna
- Agent Penny A. Clarke
- Main IPC: G06K9/38
- IPC: G06K9/38

Abstract:
An anomaly detection method includes acquiring image data corresponding to nondestructive testing (NDT) of a scanned object. The NDT image data comprises at least one inspection test image of the scanned object and multiple reference images for the scanned object. The anomaly detection method further includes generating an anomaly detection model based on a statistical analysis of one or more image features in the reference images for the scanned object and identifying one or more defects in the inspection test image, based on the anomaly detection model.
Public/Granted literature
- US20090279772A1 Method and System for Identifying Defects in NDT Image Data Public/Granted day:2009-11-12
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