发明授权
- 专利标题: Apparatus and method for the detection of forces in the sub-micronewton range
- 专利标题(中): 用于检测亚微米范围内的力的装置和方法
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申请号: US12497364申请日: 2009-07-02
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公开(公告)号: US08132268B2公开(公告)日: 2012-03-06
- 发明人: Thorsten Hugel , Michael Geisler
- 申请人: Thorsten Hugel , Michael Geisler
- 申请人地址: DE
- 专利权人: Technische Universitaet Muenchen
- 当前专利权人: Technische Universitaet Muenchen
- 当前专利权人地址: DE
- 代理机构: St. Onge Steward Johnston & Reens LLC
- 优先权: DE102007001797 20070105
- 主分类号: G01Q60/00
- IPC分类号: G01Q60/00
摘要:
A force microscope for the detection of forces in the sub-micronewton range has a measurement head which is used to carry out a relative movement with respect to a sample holder and to which a carrier molecule is attached on which probe molecules are placed.