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1.发明授权公开(公告)号：US08132268B2
公开(公告)日：2012-03-06
申请号：US12497364
申请日：2009-07-02
Applicant: Thorsten Hugel , Michael Geisler
Inventor： Thorsten Hugel , Michael Geisler
IPC: G01Q60/00
CPC classification number: G01N33/54373 , G01Q30/04 , G01Q60/28 , G01Q60/42
Abstract: A force microscope for the detection of forces in the sub-micronewton range has a measurement head which is used to carry out a relative movement with respect to a sample holder and to which a carrier molecule is attached on which probe molecules are placed.
Abstract translation: 用于检测亚微米范围内的力的力显微镜具有测量头，该测量头用于相对于样品保持器进行相对运动，并且载置分子附着在其上放置探针分子。
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2.发明申请公开(公告)号：US20100011472A1
公开(公告)日：2010-01-14
申请号：US12497364
申请日：2009-07-02
Applicant: Thorsten Hugel , Michael Geisler
Inventor： Thorsten Hugel , Michael Geisler
CPC classification number: G01N33/54373 , G01Q30/04 , G01Q60/28 , G01Q60/42
Abstract: A force microscope for the detection of forces in the sub-micronewton range has a measurement head which is used to carry out a relative movement with respect to a sample holder and to which a carrier molecule is attached on which probe molecules are placed.
Abstract translation: 用于检测亚微米范围内的力的力显微镜具有测量头，该测量头用于相对于样品保持器进行相对运动，并且载置分子附着在其上放置探针分子。
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