Invention Grant
- Patent Title: Plasma processing apparatus and plasma processing method
- Patent Title (中): 等离子体处理装置和等离子体处理方法
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Application No.: US11694153Application Date: 2007-03-30
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Publication No.: US08138445B2Publication Date: 2012-03-20
- Inventor: Naoki Matsumoto , Chishio Koshimizu , Yoshinobu Hayakawa , Hidetoshi Hanaoka , Manabu Iwata , Satoshi Tanaka
- Applicant: Naoki Matsumoto , Chishio Koshimizu , Yoshinobu Hayakawa , Hidetoshi Hanaoka , Manabu Iwata , Satoshi Tanaka
- Applicant Address: JP Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2006-092908 20060330
- Main IPC: B23K10/00
- IPC: B23K10/00

Abstract:
In a plasma processing apparatus, a first electrode is attached to a grounded evacuable processing chamber via an insulating material or a space and a second electrode disposed in parallel with the first electrode spaced apart therefrom in the processing chamber, the second electrode supporting a target substrate to face the first electrode. A first radio frequency power supply unit applies a first radio frequency power of a first frequency to the second electrode, and a second radio frequency power supply unit applies a second radio frequency power of a second frequency lower than the first frequency to the second electrode. Further, a processing gas supply unit supplies a processing gas to a processing space formed by the first and the second electrode and a sidewall of the processing chamber. Moreover, an inductor electrically is connected between the first electrode and a ground potential.
Public/Granted literature
- US20070235426A1 PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD Public/Granted day:2007-10-11
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