Invention Grant
- Patent Title: Variable resistance non-volatile memory cells and methods of fabricating same
- Patent Title (中): 可变电阻非易失性存储单元及其制造方法
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Application No.: US12796084Application Date: 2010-06-08
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Publication No.: US08138490B2Publication Date: 2012-03-20
- Inventor: Gyu-Hwan Oh , Shin-Jae Kang , In-Sun Park , Hyun-Seok Lim , Nak-Hyun Lim , Hyun-Suk Lee
- Applicant: Gyu-Hwan Oh , Shin-Jae Kang , In-Sun Park , Hyun-Seok Lim , Nak-Hyun Lim , Hyun-Suk Lee
- Applicant Address: KR
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR
- Agency: Myers Bigel Sibley & Sajovec, P.A.
- Priority: KR10-2007-0059273 20070618
- Main IPC: H01L47/00
- IPC: H01L47/00 ; H01L27/108 ; H01L29/94 ; H01L31/032

Abstract:
Methods of fabricating integrated circuit memory cells and integrated circuit memory cells are disclosed. An integrated circuit memory cell can be fabricated by forming an ohmic layer on an upper surface of a conductive structure and extending away from the structure along at least a portion of a sidewall of an opening in an insulation layer. An electrode layer is formed on the ohmic layer. A variable resistivity material is formed on the insulation layer and electrically connected to the electrode layer.
Public/Granted literature
- US20100243982A1 VARIABLE RESISTANCE NON-VOLATILE MEMORY CELLS AND METHODS OF FABRICATING SAME Public/Granted day:2010-09-30
Information query
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