Invention Grant
- Patent Title: Flare evaluation methods
- Patent Title (中): 火炬评估方法
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Application No.: US12732960Application Date: 2010-03-26
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Publication No.: US08158958B2Publication Date: 2012-04-17
- Inventor: In-Sung Kim , Jooon Park , Doo-Hoo Goo , Jeong-Hoon Lee , Chang-Min Park
- Applicant: In-Sung Kim , Jooon Park , Doo-Hoo Goo , Jeong-Hoon Lee , Chang-Min Park
- Applicant Address: KR Suwon-Si, Gyeonggi-Do
- Assignee: Samsung Electronics Co. Ltd.
- Current Assignee: Samsung Electronics Co. Ltd.
- Current Assignee Address: KR Suwon-Si, Gyeonggi-Do
- Agency: F. Chau & Associates, LLC
- Priority: KR10-2009-0030510 20090408
- Main IPC: G01T1/04
- IPC: G01T1/04

Abstract:
A flare evaluation method includes: extracting DC flare reference data using a preliminary measurement pattern mask and a dummy mask having an open region in which a preliminary measurement pattern is formed; providing a plurality of flare gauge sets including an opaque pad, a measurement pattern, and a flare pattern, the measure pattern being disposed at an inside of the opaque pad to measure strength of a flare, the flare pattern being disposed at an outside of the opaque pad to generate the flare; and detecting a change of a photo resist measurement pattern caused by the flare pattern and the measurement pattern for each of the flare gauge sets, wherein an outer radius of the flare pattern increases by a predetermined amount depending on the flare gauge set.
Public/Granted literature
- US20100258744A1 Flare Evaluation Methods Public/Granted day:2010-10-14
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