发明授权
- 专利标题: Test apparatus and test method
- 专利标题(中): 试验装置及试验方法
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申请号: US12569796申请日: 2009-09-29
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公开(公告)号: US08165027B2公开(公告)日: 2012-04-24
- 发明人: Shinichi Ishikawa , Masaru Goishi , Hiroyasu Nakayama , Masaru Tsuto
- 申请人: Shinichi Ishikawa , Masaru Goishi , Hiroyasu Nakayama , Masaru Tsuto
- 申请人地址: JP Tokyo
- 专利权人: Advantest Corporation
- 当前专利权人: Advantest Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Chen Yoshimura LLP
- 主分类号: H04J1/16
- IPC分类号: H04J1/16
摘要:
There is provided a test apparatus for testing at least one device under test, including a packet list storing section that stores a plurality of packet lists each of which includes a series of packets communicated between the test apparatus and the at least one device under test, a flow control section that designates an order of executing the plurality of packet lists in accordance with an execution flow of a test program that is designed to test the at least one device under test, and a packet communicating section that sequentially communicates the series of packets included in packet lists sequentially designated by the flow control section between the test apparatus and the at least one device under test, to test the at least one device under test.
公开/授权文献
- US20100142392A1 TEST APPARATUS AND TEST METHOD 公开/授权日:2010-06-10
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