Invention Grant
- Patent Title: Optical characteristic measurement device and optical characteristic measurement method suitable for spectrum measurement
- Patent Title (中): 适用于光谱测量的光学特性测量装置和光学特性测量方法
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Application No.: US12573140Application Date: 2009-10-04
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Publication No.: US08169607B2Publication Date: 2012-05-01
- Inventor: Hiroyuki Sano , Makoto Okawauchi , Kosei Oshima , Kazuaki Ohkubo , Tsutomu Mizuguchi , Shiro Shima
- Applicant: Hiroyuki Sano , Makoto Okawauchi , Kosei Oshima , Kazuaki Ohkubo , Tsutomu Mizuguchi , Shiro Shima
- Applicant Address: JP Osaka
- Assignee: Otsuka Electronics Co., Ltd.
- Current Assignee: Otsuka Electronics Co., Ltd.
- Current Assignee Address: JP Osaka
- Agency: Ditthavong Mori & Steiner, P.C.
- Priority: JP2008-266056 20081015; JP2009-187734 20090813
- Main IPC: G01J3/28
- IPC: G01J3/28
Abstract:
A processing unit obtains a first spectrum detected in a first detection area and a first signal intensity detected in a second detection area after the light entering the housing is cut off, and then calculates a first correction spectrum by subtracting a first correction value calculated based on the first signal intensity from each component value of the first spectrum. The processing unit obtains a second spectrum detected in the first detection area and a second signal intensity detected in the second detection area while a cut-off portion is opened, and then calculates a second correction spectrum by subtracting a second correction value calculated based on the second signal intensity from each component value of the second spectrum. The processing unit calculates an output spectrum representing a measurement result by subtracting a corresponding component value of the first correction spectrum from each component value of the second correction spectrum.
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