Invention Grant
- Patent Title: Optical characteristic measurement device and optical characteristic measurement method suitable for spectrum measurement
- Patent Title (中): 适用于光谱测量的光学特性测量装置和光学特性测量方法
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Application No.: US13306941Application Date: 2011-11-29
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Publication No.: US08169608B2Publication Date: 2012-05-01
- Inventor: Hiroyuki Sano , Makoto Okawauchi , Kosei Oshima , Kazuaki Ohkubo , Tsutomu Mizuguchi , Shiro Shima
- Applicant: Hiroyuki Sano , Makoto Okawauchi , Kosei Oshima , Kazuaki Ohkubo , Tsutomu Mizuguchi , Shiro Shima
- Applicant Address: JP Osaka
- Assignee: Otsuka Electronics Co., Ltd.
- Current Assignee: Otsuka Electronics Co., Ltd.
- Current Assignee Address: JP Osaka
- Agency: Ditthavong Mori & Steiner, P.C.
- Priority: JP2008-266056 20081015; JP2009-187734 20090813
- Main IPC: G01J3/28
- IPC: G01J3/28

Abstract:
An optical characteristic measurement device includes a photodetector and a processor. The photodetector has a detection surface greater than a light incident surface receiving light from a spectrometer. The processor is configured to obtain a measurement spectrum detected in a first detection area corresponding to the light incident surface and a signal intensity detected in a second detection area different from the light incident surface, correct a pattern prepared in advance and exhibiting a noise characteristic of the photodetector based on the signal intensity to calculate a first correction spectrum, subtract a correction value calculated based on the signal intensity from each component value of the measurement spectrum to calculate a second correction spectrum, and subtract each component value of the first correction spectrum from a corresponding component value of the second correction spectrum to calculate an output spectrum.
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