发明授权
US08185336B2 Test apparatus, test method, program, and recording medium reducing the influence of variations
失效
测试装置,测试方法,程序和记录介质减少变化的影响
- 专利标题: Test apparatus, test method, program, and recording medium reducing the influence of variations
- 专利标题(中): 测试装置,测试方法,程序和记录介质减少变化的影响
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申请号: US12261062申请日: 2008-10-30
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公开(公告)号: US08185336B2公开(公告)日: 2012-05-22
- 发明人: Yasuo Furukawa , Goerschwin Fey , Satoshi Komatsu , Masahiro Fujita
- 申请人: Yasuo Furukawa , Goerschwin Fey , Satoshi Komatsu , Masahiro Fujita
- 申请人地址: JP Tokyo JP Tokyo
- 专利权人: Advantest Corporation,The University of Tokyo
- 当前专利权人: Advantest Corporation,The University of Tokyo
- 当前专利权人地址: JP Tokyo JP Tokyo
- 代理机构: Jianq Chyun IP Office
- 主分类号: G01R31/00
- IPC分类号: G01R31/00 ; G01R31/14 ; G01R31/28
摘要:
Provided is a test apparatus that tests a device under test, including a vector expanding section that sequentially generates a plurality of test vectors; a predicting section that calculates a predicted value for each test vector by simulating an operation of the device under test, the predicted value indicating a prescribed characteristic value of the device under test to be measured while the device under test is supplied with a test signal corresponding to the test vector; a measuring section that obtains a measured value for each test vector by measuring the prescribed characteristic value of the device under test each time the device under test is supplied with a test vector; and a judging section that judges whether the device under test is defective based on a ratio between the predicted value and the measured value corresponding to each test vector.