公开(公告)号：US20100114520A1

公开(公告)日：2010-05-06

申请号：US12261062

申请日：2008-10-30

申请人： YASUO FURUKAWA ,  GOERSCHWIN FEY ,  SATOSHI KOMATSU ,  MASAHIRO FUJITA

发明人： YASUO FURUKAWA ,  GOERSCHWIN FEY ,  SATOSHI KOMATSU ,  MASAHIRO FUJITA

IPC分类号： G01R31/26

CPC分类号： G01R31/318307 ,  G01R31/3008 ,  G01R31/318342

摘要： Provided is a test apparatus that tests a device under test, including a vector expanding section that sequentially generates a plurality of test vectors; a predicting section that calculates a predicted value for each test vector by simulating an operation of the device under test, the predicted value indicating a prescribed characteristic value of the device under test to be measured while the device under test is supplied with a test signal corresponding to the test vector; a measuring section that obtains a measured value for each test vector by measuring the prescribed characteristic value of the device under test each time the device under test is supplied with a test vector; and a judging section that judges whether the device under test is defective based on a ratio between the predicted value and the measured value corresponding to each test vector.

摘要翻译： 提供了一种测试被测设备的测试设备，包括顺序地产生多个测试向量的向量扩展部分; 预测部，其通过模拟被测设备的动作来计算各测试矢量的预测值，所述预测值表示被测设备被测试的被测设备的规定特征值，所述预测值被提供有对应的测试信号 到测试矢量; 测量部，其通过在每次向被测试装置供给测试矢量时，测量被测设备的规定特征值，求出各测试矢量的测量值; 以及判断部，其基于预测值和与各测试矢量对应的测量值之间的比率来判定被测设备是否有缺陷。

公开(公告)号：US08185336B2

公开(公告)日：2012-05-22

申请号：US12261062

申请日：2008-10-30

申请人： Yasuo Furukawa ,  Goerschwin Fey ,  Satoshi Komatsu ,  Masahiro Fujita

发明人： Yasuo Furukawa ,  Goerschwin Fey ,  Satoshi Komatsu ,  Masahiro Fujita

IPC分类号： G01R31/00 ,  G01R31/14 ,  G01R31/28

CPC分类号： G01R31/318307 ,  G01R31/3008 ,  G01R31/318342

摘要： Provided is a test apparatus that tests a device under test, including a vector expanding section that sequentially generates a plurality of test vectors; a predicting section that calculates a predicted value for each test vector by simulating an operation of the device under test, the predicted value indicating a prescribed characteristic value of the device under test to be measured while the device under test is supplied with a test signal corresponding to the test vector; a measuring section that obtains a measured value for each test vector by measuring the prescribed characteristic value of the device under test each time the device under test is supplied with a test vector; and a judging section that judges whether the device under test is defective based on a ratio between the predicted value and the measured value corresponding to each test vector.

摘要翻译： 提供了一种测试被测设备的测试设备，包括顺序地产生多个测试向量的向量扩展部分; 预测部，其通过模拟被测设备的动作来计算各测试矢量的预测值，所述预测值表示被测设备被测试设备的规定特征值，所述预测值被提供有对应的测试信号 到测试矢量; 测量部，其通过在每次向被测试装置供给测试矢量时，测量被测设备的规定特征值，求出各测试矢量的测量值; 以及判断部，其基于预测值和与各测试矢量对应的测量值之间的比率来判定被测设备是否有缺陷。